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    HIOKI 3119

    Abstract: CSL-Z7302 EIA-383 JESD625-a ESD test plan JESD625 so20w CZE1000R jedec JESD625-a K6911
    Text: Application Report SZZA027A - April 2002 Electrostatic Discharge ESD Protective Semiconductor Packing Materials and Configurations Cles Troxtell and James Huckabee Standard Linear & Logic ABSTRACT The Texas Instruments Standard Linear & Logic (SLL) Business Group uses an


    Original     		PDF SZZA027A HIOKI 3119 CSL-Z7302 EIA-383 JESD625-a ESD test plan JESD625 so20w CZE1000R jedec JESD625-a K6911