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    F240

    Abstract: SN54BCT8240A SN74BCT8240A
    Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS067D – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8240A, SN74BCT8240A SCBS067D BCT8240A SN54BCT8240A 17ocal F240 SN54BCT8240A SN74BCT8240A

    SN74HC02 Spice model

    Abstract: philips semiconductor data handbook SDAD001C SDFD001B SCAD001D SN7497 spice model SN74AHC14 spice Transistor Crossreference SLLS210 ci ttl sn74ls00
    Text: LOGIC OVERVIEW 1 FUNCTIONAL INDEX 2 FUNCTIONAL CROSSĆREFERENCE 3 DEVICE SELECTION GUIDE 4 3 LOGIC SELECTION GUIDE FIRST QUARTER 1997 IMPORTANT NOTICE Texas Instruments TI reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest


    Original     		PDF

    F240

    Abstract: SN54BCT8240A SN74BCT8240A BCT8240A DB471
    Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS067D - FEBRUARY 1990 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products SN54BCT8240A . . . JT PACKAGE SN74BCT8240A . . . DW OR NT PACKAGE TOP VIEW


    OCR Scan     		PDF SN54BCT8240A, SN74BCT8240A SCBS067D BCT240 F240 SN54BCT8240A BCT8240A DB471