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Catalog Datasheet	MFG & Type	PDF	Document Tags
121C-2 Abstract: XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478 Text: The Reliability Data Program Expanded Version Jan. 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4	Original	PDF	XC4005XL PQFP-160 PLCC-84, HQFP-304, VQFP-100 XC4044XL XC4013XLA 121C-2 XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478
J-STD-020 Abstract: JSTD-020 JSTD020 235c J-STD020 Text: 01/25/2006 RELIABILITY REPORT FOR DS21Q50, Rev C1, 100 LQFP, 14x14x1.4mm Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292	Original	PDF	DS21Q50, 14x14x1 30C/60% J-STD-020 JSTD-020 JSTD020 235c J-STD020
JEDEC hast Abstract: No abstract text available Text: 04/26/05 RELIABILITY REPORT FOR DS80C400, Rev B1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : [email protected]	Original	PDF	DS80C400, JEDEC hast
XC95XXXL Abstract: XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices Text: The Reliability Data Program Expanded Version July 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4	Original	PDF	XC4005XL PQFP-160 PLCC-84, HQFP-304, VQFP-100 XC4044XL XC4013XLA XC95XXXL XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices
Ablebond 84-1LMI Abstract: 84-1LMI JESD22 0/7C62126/7V Text: Cypress Semiconductor Qualification Report QTP# 97506, VERSION 1.0 May, 1998 1 Meg SRAM, R42 Technology, Fab 4 Qualification CY62126/7V 64K x 16 Static RAM, 2.7V - 3.6V Operation Cypress Semiconductor 1 Meg SRAM, R42 Technology, Fab 4 Devices:CY62126/7V Rev. A	Original	PDF	CY62126/7V 44-pin CY7C1021V33-VC 30C/60 Ablebond 84-1LMI 84-1LMI JESD22 0/7C62126/7V
C18045 Abstract: No abstract text available Text: 08/23/2004 RELIABILITY REPORT FOR DS80CH11, Rev A4 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : [email protected]	Original	PDF	DS80CH11, 60C/60% J-STD-020 C18045
C18045 Abstract: CDA151 9918 9936 Text: 05/31/2005 RELIABILITY REPORT FOR DS80C390, Rev C3 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : [email protected]	Original	PDF	DS80C390, Reliab918 30C/60% C18045 CDA151 9918 9936
A9701 Abstract: MIL-PRF38535 XC1700D XC7000 XC9500 xc4310 XC3390A vqfp100 package XC95XX XCS40 failure Text: The Reliability Data Program Expanded Version Jan. 1, 1999 Cover P1 TABLE OF CONTENTS Introduction .… 4 The Reliability Program. .… 4	Original	PDF	PLCC-20, A9701 MIL-PRF38535 XC1700D XC7000 XC9500 xc4310 XC3390A vqfp100 package XC95XX XCS40 failure
Atmel LOT marking Abstract: Atmel 818 atmel part "marking" EIA-556-A atmel package marking ATMEL package qualification 8S02 eftec 64 AT558 Atmel MARKING CODE tqfp Text: AT55.8K Qual Pac ATMEL, Colorado Springs, Colorado 55.8 QualPack 1 ATMEL SEMICONDUCTORS Qualpack AT55.8K 1.0 Contents Cover Page………………………………………………………… 1 1.0 Contents……………………………………………………………. 2	Original	PDF
XcxxX Abstract: vqfp100 package PQFP160 XILINX mp8000ch4 marking 611 016 soic-8 XCS40 failure Xcs17 xc95144 XC95144 equivalent Text: The Reliability Data Program Expanded Version April. 1, 1999 Cover P1 TABLE OF CONTENTS Introduction .… 4 The Reliability Program. .… 4	Original	PDF	PLCC-20, XcxxX vqfp100 package PQFP160 XILINX mp8000ch4 marking 611 016 soic-8 XCS40 failure Xcs17 xc95144 XC95144 equivalent
7320CR Abstract: Eftec 64t Text: 03/06/2003 RELIABILITY REPORT FOR DS21552, Rev B1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : [email protected]	Original	PDF	DS21552, JESD78, 7320CR Eftec 64t
AT56K Abstract: atmel 936 Atmel PART marking atmel 731 ATMEL flow soldering atmel TQFP Package 64 lead code date marking kla 431 atmel MSL 1 AT5622 at56700 Text:  Semiconductors AT56K 1 QualPack AT56K  Semiconductors 1.0 Contents 1.0 Contents . 2 2.0 General Information . 3	Original	PDF	AT56K AT56K atmel 936 Atmel PART marking atmel 731 ATMEL flow soldering atmel TQFP Package 64 lead code date marking kla 431 atmel MSL 1 AT5622 at56700
8361J Abstract: mp8000ch4 Ablestik sumitomo crm EME-G700L g700l R6786-24 sumitomo EME G700L SUMITOMO g700l EME-G700 Text: February 24, 2005 CN 022405 Customer Notification Assembly Subcontractor Change for QFP and PLCC Packaged Devices Dear Valued Customer: This notification is for the purpose of informing you of a change by Mindspeed Technologies in the packages used for the following devices:	Original	PDF	CX28392-25 CX28394-25 CX28342-11 CX28343-11 CX28344-11 R6786-24 28XXX-PCN-002-A 8361J mp8000ch4 Ablestik sumitomo crm EME-G700L g700l R6786-24 sumitomo EME G700L SUMITOMO g700l EME-G700
JEDEC JESD22-B116 free Abstract: SUMIKON EME-G700 EME-G700 ablebond 3230 SUMItomo EME-G700 Sumitomo EME-G700 material Ablebond 84-1*SR4 Ablebond 8390 sumitomo G700 Tg ablebond 8390 cure time Text: Integrated Device Technology, Inc. 2975 Stender Way, Santa Clara, CA - 95054 PRODUCT/PROCESS CHANGE NOTICE PCN PCN #: SR-0212-02 DATE: 12/20/2002 Product Affected: TSOP package family (see attachment for affected part #s). Date Effective: 3/20/2003 Contact: George Snell	Original	PDF	SR-0212-02 EME-G700 JEDEC JESD22-B116 free SUMIKON EME-G700 EME-G700 ablebond 3230 SUMItomo EME-G700 Sumitomo EME-G700 material Ablebond 84-1*SR4 Ablebond 8390 sumitomo G700 Tg ablebond 8390 cure time

9936 Abstract: 9936 b EFTEC 64T Epoxy Text: 12/04/2002 RELIABILITY REPORT FOR DS21Q42 & DS21Q44 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : [email protected]	Original	PDF	DS21Q42 DS21Q44 30C/60% 9936 9936 b EFTEC 64T Epoxy