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    SNJ54BCT8244AJT Texas Instruments Scan Test Devices With Octal Buffers 24-CDIP -55 to 125 Visit Texas Instruments Buy
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    Texas Instruments SNJ54BCT8244AJT

    SCAN TEST DEVICES WITH OCTAL BUF
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    SNJ54BCT8244AJ Datasheets (2)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    SNJ54BCT8244AJT Texas Instruments Scan Test Devices With Octal Buffers 24-CDIP -55 to 125 Original PDF
    SNJ54BCT8244AJT Texas Instruments Scan Test Devices With Octal Buffers Original PDF

    SNJ54BCT8244AJ Datasheets Context Search

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    BCT244

    Abstract: F244 SN54BCT8244A SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT8244A SN54BCT8244A 17plifiers BCT244 F244 SN54BCT8244A SN74BCT8244A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E − FEBRUARY 1990 − REVISED JULY 1996 D Members of the Texas Instruments D D D D D SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244

    BCT8244A

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244 BCT8244A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244

    BCT244

    Abstract: F244 SN54BCT8244A SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT8244A SN54BCT8244A 17plifiers BCT244 F244 SN54BCT8244A SN74BCT8244A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT8244A SN54BCT8244A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E − FEBRUARY 1990 − REVISED JULY 1996 D Members of the Texas Instruments D D D D D SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244

    BCT244

    Abstract: F244 SN54BCT8244A SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT8244A SN54BCT8244A 17trollers BCT244 F244 SN54BCT8244A SN74BCT8244A

    JD 1803

    Abstract: jd 1803 IC jd 1803 data sheet SNV55LVDS31W SNV55LVDS32W jd 1803 data SMV320C6701GLPW14 54LS74A bistable multivibrator using ic 555 SNV54LVTH162245WD
    Text: Mil Sel Guide 04-home-new.qxd R 8/11/2004 2:21 PM E A L W Page 1 O R L D S I G N A L P TM R O C E S S I N G Military Semiconductors Selection Guide 2004-2005 Mil Sel Guide 04-home-new.qxd 8/11/2004 2:21 PM Page 2 Table of Contents and Introduction Enhanced Plastic


    Original     		PDF 04-home-new JD 1803 jd 1803 IC jd 1803 data sheet SNV55LVDS31W SNV55LVDS32W jd 1803 data SMV320C6701GLPW14 54LS74A bistable multivibrator using ic 555 SNV54LVTH162245WD

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E − FEBRUARY 1990 − REVISED JULY 1996 D Members of the Texas Instruments D D D D D SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244

    BCT244

    Abstract: F244 SN54BCT8244A SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT8244A SN54BCT8244A 17trollers BCT244 F244 SN54BCT8244A SN74BCT8244A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244 FSCBA004C SDYA010 SDYA012 SSYA002C, SZZU001B, SDYU001N,

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E − FEBRUARY 1990 − REVISED JULY 1996 D Members of the Texas Instruments D D D D D SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244

    jd 1803 IC

    Abstract: JD 1803 jd 1803 data sheet Mil JAN jm38510 Cross Reference LM 4017 decade counter driver bistable multivibrator using ic 555 UC1895 integrate JD 1803 eltek flatpack jd 1803 data
    Text: R E A L MILITARY SEMICONDUCTORS SELECTION GUIDE 2002 W O R L D S I G N A L P R O S E S S I N G TM Important Information AMERICAS PRODUCT INFORMATION Product Information Center PIC . . . . . . . . . . . .(972) 644-5580 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .(800) 477-8924


    Original     		PDF

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244

    Untitled

    Abstract: No abstract text available
    Text: REVISIONS LTR DATE DESCRIPTION APPROVED YR-MO-DA REV SHEET REV SHEET 15 16 17 REV STATUS OF SHEETS 18 19 STANDARDIZED MILITARY DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE 21 22 1 2 REV SHEET PMIC N/A


    Original     		PDF MIL-BUL-103. 59629172601MLX SNJ54BCT8244AJ 59629172601M3X SNJ54BCT8244A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E − FEBRUARY 1990 − REVISED JULY 1996 D Members of the Texas Instruments D D D D D SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT244

    V5050

    Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT8244A SN54BCT8244A 17plifiers V5050 BCT244 F244 SN54BCT8244A SN74BCT8244A

    TSMC 0.18 um MOSfet

    Abstract: M38510 10102BCA IDT7204L 5962-8768401MQA 0.18um LDMOS TSMC sl1053 TSMC 0.25Um LDMOS UT63M125BB SMD RTAX250S-CQ208 5962-04221
    Text: DSCC Supplemental Information Sheet for Electronic QML-38535 Specification Details: Date: 9/2/2008 Specification: MIL-PRF-38535 Title: Advanced Microcircuits Federal Supply Class FSC : 5962 Conventional: No Specification contains quality assurance program: Yes


    Original     		PDF QML-38535 MIL-PRF-38535 MIL-STD-790 MIL-STD-690 -581DSCC QML-38535 TSMC 0.18 um MOSfet M38510 10102BCA IDT7204L 5962-8768401MQA 0.18um LDMOS TSMC sl1053 TSMC 0.25Um LDMOS UT63M125BB SMD RTAX250S-CQ208 5962-04221

    5962L0053605VYC

    Abstract: 5962-9069204QXA ATMEL 302 24C16 UT9Q512E-20YCC MOH0268D UT54ACS164245SEIUCCR Z085810 5962-9762101Q2A UT28F256QLET-45UCC 5962R0250401KXA
    Text: NOT MEASUREMENT SENSITIVE MIL-HDBK-103AJ 19 SEPTEMBER 2011 SUPERSEDING MIL-HDBK-103AH 28 MARCH 2011 DEPARTMENT OF DEFENSE HANDBOOK LIST OF STANDARD MICROCIRCUIT DRAWINGS This handbook is for guidance only. Do not cite this document as a requirement. AMSC N/A


    Original     		PDF MIL-HDBK-103AJ MIL-HDBK-103AH MIL-HDBK-103AJ 5962L0053605VYC 5962-9069204QXA ATMEL 302 24C16 UT9Q512E-20YCC MOH0268D UT54ACS164245SEIUCCR Z085810 5962-9762101Q2A UT28F256QLET-45UCC 5962R0250401KXA

    BCT244

    Abstract: F244 SN54BCT8244A SN74BCT8244A SCBS042e
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT8244A SN54BCT8244A BCT244 F244 SN54BCT8244A SN74BCT8244A SCBS042e