Untitled
Abstract: No abstract text available
Text: SN74LVC00AĆEP QUADRUPLE 2ĆINPUT POSITIVEĆNAND GATE SCAS729 − NOVEMBER 2003 D Controlled Baseline D D D D D D D D D − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing
|
Original
|
PDF
|
SN74LVC00AEP
SCAS729
MIL-STD-883,
|
Untitled
Abstract: No abstract text available
Text: SN54LVC00A, SN74LVC00A QUADRUPLE 2-INPUT POSITIVE-NAND GATES www.ti.com SCAS279P – JANUARY 1993 – REVISED JULY 2005 FEATURES 1 14 2 13 3 12 4 11 5 10 6 9 7 8 VCC 4B 4A 4Y 3B 3A 3Y 1B 1Y 2A 2B 2Y 1 14 2 13 4B 3 4 12 4A 11 4Y 10 3B 5 6 9 3A 7 8 SN54LVC00A . . . FK PACKAGE
|
Original
|
PDF
|
SN54LVC00A,
SN74LVC00A
SCAS279P
SN54LVC00A
SN74LVC00A
000-V
A114-A)
A115-A)
|
lc00a
Abstract: No abstract text available
Text: SN54LVC00A, SN74LVC00A QUADRUPLE 2-INPUT POSITIVE-NAND GATES www.ti.com SCAS279P – JANUARY 1993 – REVISED JULY 2005 FEATURES 1 14 2 13 3 12 4 11 5 10 6 9 7 8 VCC 4B 4A 4Y 3B 3A 3Y 1B 1Y 2A 2B 2Y 1 14 2 13 4B 3 4 12 4A 11 4Y 10 3B 5 6 9 3A 7 8 SN54LVC00A . . . FK PACKAGE
|
Original
|
PDF
|
SN54LVC00A,
SN74LVC00A
SCAS279P
SN54LVC00A
SN74LVC00A
000-V
A114-A)
A115-A)
lc00a
|
lc00a
Abstract: No abstract text available
Text: SN54LVC00A, SN74LVC00A QUADRUPLE 2-INPUT POSITIVE-NAND GATES www.ti.com SCAS279P – JANUARY 1993 – REVISED JULY 2005 FEATURES 1 14 2 13 3 12 4 11 5 10 6 9 7 8 VCC 4B 4A 4Y 3B 3A 3Y 1B 1Y 2A 2B 2Y 1 14 2 13 4B 3 4 12 4A 11 4Y 10 3B 5 6 9 3A 7 8 SN54LVC00A . . . FK PACKAGE
|
Original
|
PDF
|
SN54LVC00A,
SN74LVC00A
SCAS279P
SN54LVC00A
SN74LVC00A
000-V
A114-A)
A115-A)
lc00a
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729A – NOVEMBER 2003 – REVISED JUNE 2005 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
|
Original
|
PDF
|
SN74LVC00A-EP
SCAS729A
MIL-STD-883,
|
Untitled
Abstract: No abstract text available
Text: SN54LVC00A, SN74LVC00A QUADRUPLE 2-INPUT POSITIVE-NAND GATES www.ti.com SCAS279P – JANUARY 1993 – REVISED JULY 2005 FEATURES 1 14 2 13 3 12 4 11 5 10 6 9 7 8 VCC 4B 4A 4Y 3B 3A 3Y 1B 1Y 2A 2B 2Y 1 14 2 13 4B 3 4 12 4A 11 4Y 10 3B 5 6 9 3A 7 8 SN54LVC00A . . . FK PACKAGE
|
Original
|
PDF
|
SN54LVC00A,
SN74LVC00A
SCAS279P
SN54LVC00A
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-Q1 QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS703B – SEPTEMBER 2003 – REVISED FEBRUARY 2008 FEATURES 1 • • • • • • • D OR PW PACKAGE TOP VIEW Qualified for Automotive Applications ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V
|
Original
|
PDF
|
SN74LVC00A-Q1
SCAS703B
MIL-STD-883,
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729B – NOVEMBER 2003 – REVISED MARCH 2007 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
|
Original
|
PDF
|
SN74LVC00A-EP
SCAS729B
MIL-STD-883,
|
Untitled
Abstract: No abstract text available
Text: SN54LVC00A, SN74LVC00A QUADRUPLE 2-INPUT POSITIVE-NAND GATES www.ti.com SCAS279P – JANUARY 1993 – REVISED JULY 2005 FEATURES 1 14 2 13 3 12 4 11 5 10 6 9 7 8 VCC 4B 4A 4Y 3B 3A 3Y 1B 1Y 2A 2B 2Y 1 14 2 13 4B 3 4 12 4A 11 4Y 10 3B 5 6 9 3A 7 8 SN54LVC00A . . . FK PACKAGE
|
Original
|
PDF
|
SN54LVC00A,
SN74LVC00A
SCAS279P
SN54LVC00A
SN74LVC00A
000-V
A114-A)
A115-A)
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729B – NOVEMBER 2003 – REVISED MARCH 2007 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
|
Original
|
PDF
|
SN74LVC00A-EP
SCAS729B
MIL-STD-883,
|
Untitled
Abstract: No abstract text available
Text: SN54LVC00A, SN74LVC00A QUADRUPLE 2-INPUT POSITIVE-NAND GATES www.ti.com SCAS279P – JANUARY 1993 – REVISED JULY 2005 FEATURES 1 14 2 13 3 12 4 11 5 10 6 9 7 8 VCC 4B 4A 4Y 3B 3A 3Y 1B 1Y 2A 2B 2Y 1 14 2 13 4B 3 4 12 4A 11 4Y 10 3B 5 6 9 3A 7 8 SN54LVC00A . . . FK PACKAGE
|
Original
|
PDF
|
SN54LVC00A,
SN74LVC00A
SCAS279P
SN54LVC00A
SN74LVC00A
000-V
A114-A)
A115-A)
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-Q1 QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS703B – SEPTEMBER 2003 – REVISED FEBRUARY 2008 FEATURES 1 • • • • • • • D OR PW PACKAGE TOP VIEW Qualified for Automotive Applications ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V
|
Original
|
PDF
|
SN74LVC00A-Q1
SCAS703B
MIL-STD-883,
|
A115-A
Abstract: C101 SN54LVC00A SN74LVC00A lc00a
Text: SN54LVC00A, SN74LVC00A QUADRUPLE 2-INPUT POSITIVE-NAND GATES www.ti.com SCAS279P – JANUARY 1993 – REVISED JULY 2005 FEATURES 1 14 2 13 3 12 4 11 5 10 6 9 7 8 VCC 4B 4A 4Y 3B 3A 3Y 1B 1Y 2A 2B 2Y 1 14 2 13 4B 3 4 12 4A 11 4Y 10 3B 5 6 9 3A 7 8 SN54LVC00A . . . FK PACKAGE
|
Original
|
PDF
|
SN54LVC00A,
SN74LVC00A
SCAS279P
SN54LVC00A
A115-A
C101
SN54LVC00A
SN74LVC00A
lc00a
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729A – NOVEMBER 2003 – REVISED JUNE 2005 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
|
Original
|
PDF
|
SN74LVC00A-EP
SCAS729A
MIL-STD-883,
|
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729B – NOVEMBER 2003 – REVISED MARCH 2007 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
|
Original
|
PDF
|
SN74LVC00A-EP
SCAS729B
MIL-STD-883,
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729B – NOVEMBER 2003 – REVISED MARCH 2007 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
|
Original
|
PDF
|
SN74LVC00A-EP
SCAS729B
MIL-STD-883,
|
LVC00
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729A – NOVEMBER 2003 – REVISED JUNE 2005 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
|
Original
|
PDF
|
SN74LVC00A-EP
SCAS729A
MIL-STD-883,
LVC00
|
SN74LVC00AMPWREP
Abstract: SN74LVC00A SN74LVC00AQDREP SN74LVC00AQPWREP
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729B – NOVEMBER 2003 – REVISED MARCH 2007 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
|
Original
|
PDF
|
SN74LVC00A-EP
SCAS729B
MIL-STD-883,
SN74LVC00AMPWREP
SN74LVC00A
SN74LVC00AQDREP
SN74LVC00AQPWREP
|
SN74LVC00A
Abstract: SN74LVC00A-Q1 SN74LVC00AQDRG4Q1 SN74LVC00AQDRQ1 SN74LVC00AQPWRG4Q1 SN74LVC00AQPWRQ1
Text: SN74LVC00A-Q1 QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS703B – SEPTEMBER 2003 – REVISED FEBRUARY 2008 FEATURES 1 • • • • • • • D OR PW PACKAGE TOP VIEW Qualified for Automotive Applications ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V
|
Original
|
PDF
|
SN74LVC00A-Q1
SCAS703B
MIL-STD-883,
SN74LVC00A
SN74LVC00A-Q1
SN74LVC00AQDRG4Q1
SN74LVC00AQDRQ1
SN74LVC00AQPWRG4Q1
SN74LVC00AQPWRQ1
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-Q1 QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS703B – SEPTEMBER 2003 – REVISED FEBRUARY 2008 FEATURES 1 • • • • • • • D OR PW PACKAGE TOP VIEW Qualified for Automotive Applications ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V
|
Original
|
PDF
|
SN74LVC00A-Q1
SCAS703B
MIL-STD-883,
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-Q1 QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS703B – SEPTEMBER 2003 – REVISED FEBRUARY 2008 FEATURES 1 • • • • • • • D OR PW PACKAGE TOP VIEW Qualified for Automotive Applications ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V
|
Original
|
PDF
|
SN74LVC00A-Q1
SCAS703B
MIL-STD-883,
|
SN74LVC00A-EP
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729A – NOVEMBER 2003 – REVISED JUNE 2005 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
|
Original
|
PDF
|
SN74LVC00A-EP
SCAS729A
MIL-STD-883,
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729A – NOVEMBER 2003 – REVISED JUNE 2005 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
|
Original
|
PDF
|
SN74LVC00A-EP
SCAS729A
MIL-STD-883,
|
Untitled
Abstract: No abstract text available
Text: SN74LVC00A-EP QUADRUPLE 2-INPUT POSITIVE-NAND GATE www.ti.com SCAS729B – NOVEMBER 2003 – REVISED MARCH 2007 • FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C
|
Original
|
PDF
|
SN74LVC00A-EP
SCAS729B
MIL-STD-883,
|