Sharp Semiconductor Lasers
Abstract: AU4A transistor QB tensile-strength thermopile array BREAK FAILURE INDICATOR APPLICATIONS LIST relay failure analysis CRACK DETECTION PATTERNS gold wire bound failures due to ultrasonic cleaning 2n2222 micro electronics
Text: Application Note Optoelectronics Failure Analysis of Optoelectronic Devices DEFINITIONS • US Military Standard: MIL-STD-883 Method 5003 Failure Analysis Procedures for Microcircuits – Failure analysis is a post-mortem examination of a failed device employing, as required, electrical
|
Original
|
PDF
|
MIL-STD-883
SMA04033
Sharp Semiconductor Lasers
AU4A
transistor QB
tensile-strength
thermopile array
BREAK FAILURE INDICATOR APPLICATIONS LIST
relay failure analysis
CRACK DETECTION PATTERNS
gold wire bound failures due to ultrasonic cleaning
2n2222 micro electronics
|
acousto optic Modulator
Abstract: GR-468 DS-7024 SM 1060
Text: Acousto Optic Modulator Features • • • • • • • Hermetic to MIL-Std 883 Rugged laser welded construction Fast rise / fall time High throughput High contrast ratio High PER Wide operating temperature range Applications • • • • Fast optical shutter
|
Original
|
PDF
|
EM416
EM416-01
acousto optic Modulator
GR-468
DS-7024
SM 1060
|
acousto optic Modulator
Abstract: GR-468 single mode fiber bend radius
Text: Acousto Optic Modulator Features • • • • • • • Hermetic to MIL-Std 883 Rugged laser welded construction Fast rise / fall time High throughput High contrast ratio High PER Wide operating temperature range Applications • • • • Fast optical shutter
|
Original
|
PDF
|
em381
acousto optic Modulator
GR-468
single mode fiber bend radius
|
M2003
Abstract: No abstract text available
Text: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO-92 P-J Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 80 250 hrs, 500 hrs 200_C + N2 0.00 DIE PUNCH 30 MIL-STD-883 0.00 HAST 330 100 hrs
|
Original
|
PDF
|
MIL-STD-883
M2003
23-Oct-03
M2003
|
M2003
Abstract: No abstract text available
Text: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO-220 P-J Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 120 250 hrs, 500 hrs 200_C + N2 0.00 DIE PUNCH 45 MIL-STD-883 0.00 HAST 495 100 hrs
|
Original
|
PDF
|
O-220
MIL-STD-883
M2003
23-Oct-03
M2003
|
72590
Abstract: M2003
Text: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO-263 P-J Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 40 250 hrs, 500 hrs 200_C + N2 0.00 DIE PUNCH 15 MIL-STD-883 0.00 HAST 165 100 hrs
|
Original
|
PDF
|
O-263
MIL-STD-883
M2003
23-Oct-03
72590
M2003
|
M25P10
Abstract: ST M25P10 SO8 Wide Package QRFS0001 ATM-.100 M25P
Text: QRFS0001 QUALIFICATION REPORT M25P10 Using CMOST6X-U35 Technology at Agrate R1 Fab Table 1. Product and Process being Qualified Product M25P10 Package SO8 Process CMOST6X-U35 Fab Line Agrate R1 PRODUCT DESCRIPTION The M25P10 is a 1 Mbit 128K x 8 bit Low Voltage, Paged Flash Memory, accessed by a 20 MHz SPI
|
Original
|
PDF
|
QRFS0001
M25P10
CMOST6X-U35
CMOST6X-U35
M25P10
ST M25P10
SO8 Wide Package
QRFS0001
ATM-.100
M25P
|
SO8 Wide Package
Abstract: M25P10 QRFS0002
Text: QRFS0002 QUALIFICATION REPORT M25P10 Using CMOST6X-U35 Technology at Catania M5 Fab Table 1. Product and Process being Qualified Product M25P10 Package SO8 Process CMOST6X-U35 Fab Line Catania M5 PRODUCT DESCRIPTION The M25P10 is a 1 Mbit 128K x 8 bit Low Voltage, Paged Flash Memory, accessed by a 20 MHz SPI
|
Original
|
PDF
|
QRFS0002
M25P10
CMOST6X-U35
CMOST6X-U35
M25P10
SO8 Wide Package
QRFS0002
|
Untitled
Abstract: No abstract text available
Text: Q-TECH ONE INCH SQUARE LOW PHASE NOISE OCXO 3.3 to 12Vdc - 1MHz to 125MHz CORPORATION Description Q-Tech’s High Stability OCXO is a high reliability signal generator that provides an HCMOS or Sine Wave output. The OCXO is available in a Through hole package.
|
Original
|
PDF
|
12Vdc
125MHz
QT5006SJM-100
000MHz
10kHz
20MHz,
QT5006S,
QT5006SJ-100
|
M24C128
Abstract: 16KX8 M24128 M24C64 QREE0031 TSSOP14 STMicroelectronics lot number m24c64
Text: QREE0031 QUALIFICATION REPORT TSSOP8 / TSSOP14 High Density Lead Frame ANAM THIS REPORT This Qualification Report summarizes the reliability trials and results performed to qualify High Density Lead Frame HDLF used on TSSOP8 (Thin Shrink Small Outline Package) and TSSOP14 by our
|
Original
|
PDF
|
QREE0031
TSSOP14
TSSOP14
M24C128
16KX8
M24128
M24C64
QREE0031
STMicroelectronics lot number m24c64
|
Untitled
Abstract: No abstract text available
Text: Q-TECH ONE INCH SQUARE LOW PHASE NOISE OCXO 3.3 to 12Vdc - 1MHz to 125MHz CORPORATION Description Q-Tech’s High Stability OCXO is a high reliability signal generator that provides an HCMOS or Sine Wave output. The OCXO is available in a Through hole package.
|
Original
|
PDF
|
12Vdc
125MHz
QT5006SJM-100
000MHz
10kHz
20MHz,
QT5006S,
QT5006SJ-100
|
Untitled
Abstract: No abstract text available
Text: HIGH STABILITY DIGITAL TCXO Q-TECH CORPORATION SURFACE MOUNT CRYSTAL OSCILLATORS 3.3 to 5Vdc - 1MHz to 125MHz Description Q-Tech’s High Stability Digital TCXO is a high reliability signal generator that provides an HCMOS output. The TCXO is available in a Surface Mount SMD package.
|
Original
|
PDF
|
125MHz
QT3103CU-27
480MHz
QPDS-0009
|
QPDS-0009
Abstract: No abstract text available
Text: HIGH STABILITY DIGITAL TCXO Q-TECH CORPORATION SURFACE MOUNT CRYSTAL OSCILLATORS 3.3 to 5Vdc - 1MHz to 125MHz Description Q-Tech’s High Stability Digital TCXO is a high reliability signal generator that provides an HCMOS output. The TCXO is available in a Surface Mount SMD package.
|
Original
|
PDF
|
125MHz
QT3103CU-27
480MHz
QPDS-0009
QPDS-0009
|
Untitled
Abstract: No abstract text available
Text: Rev.1 Date: 2012-02‐10 Specification AXIOM6060 Oscillator type : OCXO with Low Phase Noise for Space Application Parameter Nominal frequency Frequency stability Initial tolerance before screening test Initial tolerance after screening test
|
Original
|
PDF
|
AXIOM6060Â
IPC610
|
|
|
MBD3057-C18
Abstract: MBD2057-C18 DIODE e26 back Tunnel diode MBD1057
Text: JMAR BACK TUNNEL DIODES m «|h Frequency Detector Series (To 18 GHz) U L = FEATURES • • • • • Rugged Germanium Planar Construction Excellent Temperature Stability No DC Bias Required Wide Video Bandwidth MIL-STD-19500 & 883 Capability M AXIM UM RATINGS
|
OCR Scan
|
PDF
|
MIL-STD-19500
MBD-1057-C18
MBD-1057-T80
MBD-1057-T54
MBD-1057-H20
MBD-1057-E26
MBD-2057-C18
MBD-2057-T80
MBD-2057-T54
MBD-2057-H20
MBD3057-C18
MBD2057-C18
DIODE e26
back Tunnel diode
MBD1057
|
MBD3057-C18
Abstract: MBD5057-C18 back Tunnel diode MBD-3057-C18 MIL-STD-195 MBD5057 MBD2057-C18 MBD-1057-C18 MBD1057
Text: PLANAR BACK TUNNEL DIODES m T ^ High Frequency D e te c to r Series (To 18 GHz) IB = oti^ rationS FEATURES • Rugged Germanium Planar Construction • Excellent Temperature Stability • No DC Bias Required • Wide Video Bandwidth • MIL-STD-195 00 & 883 Capability
|
OCR Scan
|
PDF
|
MIL-STD-195
MBD-1057-C18
MBD-1057-T80
MBD-1057-T54
MBD-1057-H20
MBD-1057-E26
MBD-2057-C18
MBD-2057-T80
MBD-2057-T54temperature,
MBD3057-C18
MBD5057-C18
back Tunnel diode
MBD-3057-C18
MBD5057
MBD2057-C18
MBD1057
|
MBD2057-C18
Abstract: No abstract text available
Text: FEATURES • • • • • Rugged Germanium Planar Construction Excellent Temperature Stability No DC Bias Required Wide Video Bandwidth MIL-STD-19500 & 883 Capability M A X IM U M RATINGS Storage Tem perature. -6 5 to +125°C Operating T e m p e ra tu re . -6 5 to +110°C
|
OCR Scan
|
PDF
|
MIL-STD-19500
MBD2057-C18
|
Untitled
Abstract: No abstract text available
Text: Power M anagem ent Division Power M anagem ent Division Sm artpack pow er m odules Sam ple Sm artpack package outlines not to scale T hank s to Smartpack, designing high power circuits has never been easier. Sm artpack T echnology offers engineers the b e n efits of ex c e lle n t pow er dissipation and
|
OCR Scan
|
PDF
|
|
Untitled
Abstract: No abstract text available
Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability We put quality first. No matter what it takes, or what kind of problems we run into, our goal is to provide a constant supply of high quality products to our cus tomers both at home and abroad, in the quantities they
|
OCR Scan
|
PDF
|
min/10
min/30
|
Untitled
Abstract: No abstract text available
Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put quality first. N o matter what it takes, or what kind of problem s we run into, our goal is to provide a constant sup p ly of high quality products to our c u s tomers both at home and abroad, in the quantities they
|
OCR Scan
|
PDF
|
min/10
min/30
|
Untitled
Abstract: No abstract text available
Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put quality first. No m atter w hat it takes, or w hat Incidental failures are determined by the design quality kind of problem s w e run into, our goal is to provide a
|
OCR Scan
|
PDF
|
min/10
min/30
|
Untitled
Abstract: No abstract text available
Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability We put quality first. No m atter what it takes, or what kind of problem s we run into, our goal is to provide a constant supply of high quality products to our cus tomers both at home and abroad, in the quantities they
|
OCR Scan
|
PDF
|
min/10
min/30
|
Untitled
Abstract: No abstract text available
Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put q u a lity first. No m a tte r w h a t it ta k e s , or w h a t Incidental failures are determ ined by the design quality kind of p ro b le m s w e run into, our g oal is to p ro vid e a
|
OCR Scan
|
PDF
|
min/10
|
Untitled
Abstract: No abstract text available
Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put quality first. No m atter w hat it takes, or w hat Incidental failures are determined by the design quality kind of problem s we run into, our goal is to provide a of the product, so we work to lower our incidental fail
|
OCR Scan
|
PDF
|
min/10
|
