JESD22
Abstract: No abstract text available
Text: RELIABILITY REPORT Date: 7/27/11 QUALITY ENG : PART NUMBER MICREL QA/REL KSZ8842PMBL AM QUAL VEHICLES PACKAGE TYPE : ASSEMBLY FAB PROCESS KSZ8842PMBL AM 100 LFBGA OSE TSMC 0.15 um KSZ8842PMQL AM 128L PQFP ASE TSMC 0.15 um AEC Q100 GROUP A QUALIFICATION RESULTS:
|
Original
|
PDF
|
KSZ8842PMBL
KSZ8842PMQL
JESD22
121C/100%
-50C/
KSZ8842PMBL
GFS0028
JESD22
|
Untitled
Abstract: No abstract text available
Text: RELIABILITY REPORT Date:7/24/08 QUALITY ENG : PART NUMBER MICREL QA/REL KSZ8893MQL/FQL Qual vehicles PACKAGE TYPE : ASSEMBLY 128L QFP OSE KSZ8893MQL FAB LOC PROCESS TSMC 0.15 um ESD RATINGS LATCH-UP RATING FIT +/- 1000V HBM I/O Trigger @ 200 mA TSMC 0.15 um : 6.6 FIT
|
Original
|
PDF
|
KSZ8893MQL/FQL
KSZ8893MQL
KSZ8893MQL)
KSZ8893FQL)
168HRS
1000HRS
KSZ8893
GFS7975
GFP2177
|
Untitled
Abstract: No abstract text available
Text: RELIABILITY REPORT Date: 10/17/08 QUALITY ENG : PART NUMBER MICREL QA/REL KSZ8841/42 PMQL Qual vehicles KSZ8841/42PMQL PACKAGE TYPE : ASSEMBLY FAB LOC 128L QFP ASE/TICP TSMC ESD RATINGS FIT RATE ESD-HBM: +/- 1500V TSMC 0.15 um process: 6.6 FIT PROCESS 0.15 um
|
Original
|
PDF
|
KSZ8841/42
KSZ8841/42PMQL
KSZ8841
KSZ8842
KSZ8841/42
JESD22-A108
1000HRS
2000HRS
GFS7975
GFS0028
|
Untitled
Abstract: No abstract text available
Text: CMOS 0.15 micron Process OPERATING LIFE @ Tj = + 130-150c at rated Voltage Lot. Pkg Vcc Act Qty Hrs GFN0948.3 GFK2149.3MEC GFN0944.1M03 GFK7343.1MEG GFK2149.3MEB GF62828.7MEA GFK7343.1MEG GFN0948.3 GF3Y097.1M08 GFN8398.2 GFN8400.3 GFP5701.2 GFN8398.2 GFN8400.3
|
Original
|
PDF
|
130-150c
GFN0948
GFK2149
GFN0944
GFK7343
GF62828
GF3Y097
|