nichicon capacitor
Abstract: nichicon aluminum capacitor nichicon catalog Electric Double Layer Capacitors, Radial Lead Type NICHICON CAPACITORS CATALOG
Text: Automotive Application Catalog Standard Process for Developing Custom Products 2015.3 We propose the best products for our customers, based on application, size and a variety of other design needs. Customer Nichicon Evaluation and approval of verification testing,
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IEC61851-1
AC100
nichicon capacitor
nichicon aluminum capacitor
nichicon catalog
Electric Double Layer Capacitors, Radial Lead Type
NICHICON CAPACITORS CATALOG
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306E-09
Abstract: MQFP-208 XC7000 XC4005E PHYSICAL HT 208 X9500 XC1700D XC2000 XC4000E XC5000
Text: Reliability Testing Summary High Temperature Life Test Qualification & Monitor Combined Technology: Device Type: Package Type: Actual Temperature Actual Voltage: Assumed Activation Energy: XC1700D Period: 26 Combined Started Lot: 26 Combined Completed Lots:
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XC1700D
XC1700D,
XC2000,
XC3000/A,
XC3100/A,
XC4000
XC2000
XC3000/A
XC3100/A
306E-09
MQFP-208
XC7000
XC4005E PHYSICAL
HT 208
X9500
XC1700D
XC2000
XC4000E
XC5000
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5082-2080
Abstract: 5082-2826 5082-2835 MTTF 5965-8870E Y2272 DOD-HDBK-1686
Text: Passivated General Purpose Schottky Diodes Reliability Data The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-750. Data was gathered from the 1N5711/12 5082-2800/04/05
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MIL-STD-750.
1N5711/12
DOD-HDBK-1686
5082-28XX
5082-2080
5082-2826
5082-2835
MTTF
5965-8870E
Y2272
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Untitled
Abstract: No abstract text available
Text: Product Specification Grace Inertia Connector 2.0 EV 108-106001 23MAR.’09 REV:E 1 Scope : 1.1 Contents This specification covers the requirements for product performance, test methods and quality assurance provisions of GIC 2.0 EV. Applicable product description and part numbers are as shown in Appendix 1.
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23MAR.
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1N5711, 5082-2800
Abstract: No abstract text available
Text: 1N5711, 5082-2800 1N5712, 5082-2810/11 5082-2835 Avago Technologies Glass Package RF Schottky Diodes Reliability Data Sheet Description The following cumulative test results have been obtained from testing performed at Avago Technologies. For the purpose of this reliability data sheet, a failure is
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1N5711,
1N5712,
Y2116
axes116
Hermeticity1017
minimum176
Atmosphere104110
DOD-HDBK-1686
5082-28xx
5988-3940EN
1N5711, 5082-2800
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ARM-184
Abstract: ASM-663 1030mhz ARINC 568 AC0820 Transponder ID 48 mil 50071 G.N.M 2nd year IFR 640 AN/ARM-184
Text: Avionics IFR 6015 Ramp Test Set The IFR 6015 is a compact, lightweight and weatherproof unit designed for testing transponder modes 1,2,3A/C/S, TCAS I, II and Military E-TCAS as well as TACAN. • One main user screen for each test mode • Detachable antenna
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AN/ASM-663,
AN/ARM-184,
ARM-184
ASM-663
1030mhz
ARINC 568
AC0820
Transponder ID 48
mil 50071
G.N.M 2nd year
IFR 640
AN/ARM-184
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JIS C 7021 A10
Abstract: AVAGO DIP
Text: HLMP-NM30 / NS30 High Power T1 3 mm Plastic Lamps Reliability Data Sheet Description The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revisions of MIL-STD-883 and JIS C 7021.
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HLMP-NM30
MIL-STD-883
hours10
hrs10
5988-4544EN
JIS C 7021 A10
AVAGO DIP
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JEP122
Abstract: manson college website design 100C
Text: Knowledge Based Reliability Evaluation of New Package Technologies Utilizing Use Conditions March 1999 Order Number: 245162-001 Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual
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Untitled
Abstract: No abstract text available
Text: Integrated Resistor Lamps Reliability Data The following cumulative test results have been obtained from testing performed at HP Optoelectronics Division in accordance with the latest revision of MIL-STD-883. T-1 and T-1 3/4 Lamps, 5 V and 12 V Series. Subminiature Lamps
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MIL-STD-883.
5965-7733E
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Denso L 918 8
Abstract: Denso L 918 P-PGA-132 MQFP-208 XC4000 XC4000E XC5000 XC1765D 145C XC1700D
Text: The Reliability Data Program October 1, 1996 Expanded Version Index • • • • • • HTOL High Temperature Operating Life . 85/85 (Bias Moisture Life). PCT (Unbiased Pressure Pot).
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PLCC-20,
Denso L 918 8
Denso L 918
P-PGA-132
MQFP-208
XC4000
XC4000E
XC5000
XC1765D
145C
XC1700D
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yazaki terminals
Abstract: AEV110122 AEV18024 matsushita varistor ZNR YAZAKI 7283 znr varistor y YAZAKI 7283-1020 YAZAKI 7282-1020 AEV19024 matsua varistor ZNR
Text: EV AEV CAPSULE CONTACT MECHANISM AND HIGH-CAPACITY CUTOFF COMPACT RELAY FEATURES 10A 80A 300A RoHS Directive compatibility information http://www.nais-e.com/ 1. High-voltage, high-current control capable 400 V DC high-voltage switching cutoff has been achieved thanks to a sealed
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C2809-1992.
yazaki terminals
AEV110122
AEV18024
matsushita varistor ZNR
YAZAKI 7283
znr varistor y
YAZAKI 7283-1020
YAZAKI 7282-1020
AEV19024
matsua varistor ZNR
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JESD22-B104-B
Abstract: JESD22-b103 JESD22-B104 iP1201 transistor Amp 2054 equivalent C1173 JESD22-B103B JESD22-B103-B
Text: International Rectifier Reliability Report for iPOWIR Family iP1001, iP1201, iP1202, iP2001, iP2002, iP2003 20-Apr-04 iPOWIR Family Reliability Testing Summary 4/20/2004 1 . HTOL - High Temperature Operating Life Test Failure Rate Device Number Conditon Samples
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iP1001,
iP1201,
iP1202,
iP2001,
iP2002,
iP2003
20-Apr-04
iP1001
iP2001
iP2002
JESD22-B104-B
JESD22-b103
JESD22-B104
iP1201
transistor Amp 2054 equivalent
C1173
JESD22-B103B
JESD22-B103-B
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maxim 77
Abstract: No abstract text available
Text: Maxim Integrated Products 120 San Gabriel Drive Sunnyvale, CA 94086 Phone: 408-737-7600, FAX: 408-470-5841 Product Reliability Qualification Document ID: 10-3006, Rev. H Maxim Integrated Products Effective: 6/27/01 TABLE OF CONTENTS PURPOSE. 3
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C/1000
C/192
maxim 77
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INCOMING leadframe INSPECTION procedure
Abstract: mttf water distribution INCOMING Plate INSPECTION
Text: May 1997 Quality Assurance 2-1 Ericsson Components AB is the main company within the components business area in the Ericsson Coporation. An overall quality policy, common to all business areas, is defined by the Ericsson Corporate Executive Committee. Pre-specification
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photodiode lens siemens
Abstract: siemens spc 2
Text: APPLICATIONS OPTOELECTRONICS Wilhelm Kraus ● Gerhard Kuhn Quality assurance in fiber optic components: BIDI module passes Bellcore test The BIDI bidirectional module developed by Siemens shows how fiber optic components can meet exacting quality requirements. The module has
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TRANSISTOR A104b
Abstract: TRANSISTOR A107 EIAJ ED-4701 305 water pumping machine control schematic electromigration calculation for TTL smd transistor AIT AAAA series SMD transistor schematic diagram atom ED-4701 A103-C
Text: [ 3 ] Reliability Testing Contents 1. What is Reliability Testing . 1 1.1 Significance and Purpose of Reliability Testing. 1 1.2 1.3 Before Testing . 1
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15000m/s2,
200000m/s2,
TRANSISTOR A104b
TRANSISTOR A107
EIAJ ED-4701 305
water pumping machine control schematic
electromigration calculation for TTL
smd transistor AIT
AAAA series SMD transistor
schematic diagram atom
ED-4701
A103-C
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HEDS-9700
Abstract: No abstract text available
Text: Small Optical Encoder Modules Reliability Data HEDS-9700 Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revision of MIL- STD-883. Hewlett-Packard tests parts at
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HEDS-9700
STD-883.
MIL-STD-883C
5091-5076E
5965-2832E
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MIL-STD-883 method 2003
Abstract: No abstract text available
Text: HDSP-Uxxx, HDSP-Axxx, HDSP-3xxx, HDSP-4xxx, HDSP-7xxx Seven Segment Displays – Ultra Mini, 0.3 " Mini, 0.3 " Reliability Data Sheet Description The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of MIL-STD-883.
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MIL-STD-883.
MIL-STD-883
5988-0729EN
MIL-STD-883 method 2003
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Untitled
Abstract: No abstract text available
Text: Optical Encoder Modules Reliability Data HEDT-9040, 9140 Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revision of MIL- STD-883. Hewlett-Packard tests parts at
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HEDT-9040,
STD-883.
MIL-STD-883C
5965-3478E
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HEDS-5500
Abstract: HEDS-6500 HEDS-9000
Text: HEDS-5500, HEDS-6500 and HEDS-9000, 9100, 9200 Series Motion Sensing Products, Optical Encoder Modules Reliability Data Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of MIL- STD-883.
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HEDS-5500,
HEDS-6500
HEDS-9000,
STD-883.
MIL-STD-883C
5965-2775E
5965-9642E
HEDS-5500
HEDS-9000
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TR902
Abstract: No abstract text available
Text: AMP J - 0 0 2 m LO I no Product Specification CO 108-5351 o AMP-LATCH Series. FCRC Puddle card Connector This specification may change without notice as a result of product design change amd product evaluation testing. Eo m <D CD ♦_> QJ - 1. Scope : 1.1
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216093-X
TR902
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XLO8
Abstract: diode hp 5082-2080 hp 5082-2830 DOD-HDBK-1686A DOD-HDBK-1686 hp 5082-2900 diode
Text: WhoI H EW L E T T 1 "KM PA CK A R D Tri Metal Beam Lead Schottky Diodes Reliability Data HSCH-5300 Series HSCH-5500 Series Conclusion Hewlett-Packard’s beam lead diodes have successfully passed stringent environmental testing. Hewlett-Packard beam lead diodes may be used in military
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HSCH-5300
HSCH-5500
MIL-STD-750
1051C
DOD-HDBK-1686
XLO8
diode hp 5082-2080
hp 5082-2830
DOD-HDBK-1686A
hp 5082-2900 diode
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114-1010
Abstract: 109-21
Text: APR 13 1987 NOV 0 91989 PRODUCT SPECIFICATION 1 SC0PE 1.1. TENTATIVE Content This specification covers the performance, tests and quality requirements for the AMP* Circular Multi-Pin Connectors with removable crimp contacts and the printed circuit board headers with fixed contacts. The connectors are designed for use
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1197X
Abstract: No abstract text available
Text: Quality and Reliability CO M M ITM EN T T O Q U A L IT Y Dense-Pac Microsystems produces only high quality modules and m onolithic devices. Q uality is designed into all products, whether utilized in military or in commercial applications. Long term reliability is the standard by
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MIL-l-45208.
MIL-STD-883.
197XT*
1197X
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