variable frequency generator circuit diagram
Abstract: No abstract text available
Text: Driver circuit for CMOS linear image sensor C10808 series High-precision driver circuit with variable integration time function The C10808 series is a driver circuit specifically designed for the HAMAMATSU S10111 to S10114 series current-output type CMOS linear image sensors. The C10808 series driver circuit supplies various timing signals necessary for image sensor
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C10808
S10111
S10114
C10808)
C10808-01)
KACC1181E01
variable frequency generator circuit diagram
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S10111
Abstract: No abstract text available
Text: CMOS linear image sensors S10111 to S10114 series Current-output type sensors with variable integration time function The S10111 to S10114 series are self-scanning photodiode arrays designed speciÝcally as detectors for spectroscopy. The scanning circuit operates at low power consumption and is easy to handle. Each photodiode has a large photosensitive area
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S10111
S10114
SE-171
KMPD1090E08
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Untitled
Abstract: No abstract text available
Text: IMAGE SENSOR CMOS linear image sensor S10111 to S10114 series Current-output type sensors with variable integration time function S10111 to S10114 series are self-scanning photodiode arrays designed specifically as detectors for spectroscopy. The scanning circuit operates
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S10111
S10114
SE-171
KMPD1090E02
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variable frequency generator circuit diagram
Abstract: linear cmos logic
Text: Driver circuit for CMOS linear image sensor C10808 series High-precision driver circuit with variable integration time function The C10808 series is a driver circuit specifically designed for the HAMAMATSU S10111 to S10114 series current-output type CMOS linear image sensors. The C10808 series driver circuit supplies various timing signals necessary for image sensor
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C10808
S10111
S10114
C10808)
C10808-01)
SE-171
KACC1181E01
variable frequency generator circuit diagram
linear cmos logic
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Untitled
Abstract: No abstract text available
Text: CMOS linear image sensors S10111 to S10114 series Current-output type sensors with variable integration time function The S10111 to S10114 series are self-scanning photodiode arrays designed speci¿cally as detectors for spectroscopy. The scanning circuit operates at low power consumption and is easy to handle. Each photodiode has a large active area with high UV sensitivity.
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S10111
S10114
SE-171
KMPD1090E07
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S10114-1024Q
Abstract: No abstract text available
Text: CMOS linear image sensors S10111 to S10114 series Current-output type sensors with variable integration time function The S10111 to S10114 series are self-scanning photodiode arrays designed speci¿cally as detectors for spectroscopy. The scanning circuit operates at low power consumption and is easy to handle. Each photodiode has a large photosensitive area
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S10111
S10114
SE-171
KMPD1090E08
S10114-1024Q
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S10124
Abstract: No abstract text available
Text: Driver circuit for CMOS linear image sensor C10808 series High-precision driver circuit with variable integration time function The C10808 series is a driver circuit specifically designed for the HAMAMATSU S10111 to S10114, S10121 to S10124 series current-output type CMOS linear image sensors. The C10808 series driver circuit supplies various timing signals necessary for
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C10808
S10111
S10114,
S10121
S10124
KACC1181E04
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R614-83-422
Abstract: No abstract text available
Text: Driver circuit for CMOS linear image sensor C10808 series High-precision driver circuit with variable integration time function The C10808 series is a driver circuit specifically designed for the HAMAMATSU S10111 to S10114 series current-output type CMOS linear image sensors. The C10808 series driver circuit supplies various timing signals necessary for image sensor
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C10808
S10111
S10114
C10808)
C10808-01)
KACC1181E02
R614-83-422
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S10111
Abstract: 1000 hz cmos Image Sensors hamamatsu 256 channel photodiode s1011
Text: CMOS linear image sensors S10111 to S10114 series Current-output type sensors with variable integration time function The S10111 to S10114 series are self-scanning photodiode arrays designed speci¿cally as detectors for spectroscopy. The scanning circuit operates at low power consumption and is easy to handle. Each photodiode has a large active area with high UV sensitivity.
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S10111
S10114
SE-171
KMPD1090E07
1000 hz cmos Image Sensors
hamamatsu 256 channel photodiode
s1011
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Abstract: No abstract text available
Text: CMOSリニアイメージセンサ用駆動回路 C10808シリーズ 蓄積時間の可変機能付き高精度駆動回路 C10808シリーズは、電流出力タイプCMOSリニアイメージセンサ S10111～S10114, S10121～S10124シリーズ用に設計さ
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C10808ã
S10111ï
S10114,
S10121ï
S10124ã
S10121
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C10500
Abstract: No abstract text available
Text: セレクションガイド 2013.11 イメージセンサ 幅 広 い 波 長 範 囲 に 対 応した 計 測 用 イメ ー ジ セ ン サ IMAGE SENSOR イメージセンサ 幅広い波長範囲に対応した 計測用イメージセンサ 浜 松ホトニクスは赤 外から可 視・紫 外・真 空 紫 外・
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S11830-3344MF
Abstract: No abstract text available
Text: NEWS 01 2011 Solid state PRODUCTS PAGE 11 Thumb-sized “ultra-compact spectrometer” with VIS-NIR response SOLID STATE PRODUCTS PAGE 16 New developments for the MPPC ELECTRON TUBE PRODUCTS PAGE 21 H2D2 light sources L11788 series, L11789 series SYSTEMS PRODUCTS
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L11788
L11789
C11367
DE128228814
S11830-3344MF
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S10121
Abstract: No abstract text available
Text: CMOS linear image sensors S10121 to S10124 series High sensitivity and smoothly varying spectral response in UV region current-output type sensors with variable integration time function The S10121 to S10124 series are self-scanning photodiode arrays designed specifically as detectors for spectroscopy. The
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S10121
S10124
B1201,
KMPD1148E01
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S10011
Abstract: S10045 S10046 S10035 S10110 S10063 S10071 S10100 S10090 S10115
Text: S10000 Series Fixed Chip Inductors for Space Applications FEATURES Military QPL Approved. Pick-and-place compatible. SPECIFICATIONS Met the requirements of MIL-PRF83446 and MIL-STD-981, class S or class B. Class S parts are intended for critical flight and mission-essential ground
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S10000
MIL-PRF83446
MIL-STD-981,
MIL-STD-202,
S10011
S10045
S10046
S10035
S10110
S10063
S10071
S10100
S10090
S10115
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Selection guide
Abstract: United Detector Technology PSD
Text: Selection guide - September 2013 Opto-semiconductor Modules Related products and circuits that enable semiconductor elements to operate at peak performance. A broad range of customization is available. HAMAMATSU PHOTONICS K.K. Opto-semiconductor Modules Related products and circuits that enable
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KACC0001E02
Selection guide
United Detector Technology PSD
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Abstract: No abstract text available
Text: 技術資料 蓄積時間可変機能付／電流出力タイプ CMOSリニアイメージセンサ S10121~S10124シリーズ [図１] ブロック図 特長 1 a NMOSリニアイメージセンサ (S390Xシリーズ) 従来の電流出力タイプNMOSリニアイメージセンサの場
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S10121â
S10124ã
S390Xã
KMPD9008J02
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Untitled
Abstract: No abstract text available
Text: Technical information Current output type CMOS linear image sensors with variable integration time function S10121 to S10124 series 1 [Figure 1] Block diagram Features a NMOS linear image sensor (S3901 to S3904 series) Start pulse In previous current output type NMOS linear image
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S10121
S10124
S3901
S3904
B1201,
KMPD9008E01
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S10111
Abstract: S10111S10114 S10113-256Q
Text: IMAGE SENSOR CMOSリニアイメージセンサ S10111~S10114シリーズ 蓄積時間の可変機能付高い紫外感度の電流出力型センサ 分光光度計用の検出器として設計された自己走査型フォトダイオードアレイです。走査回路は、低消費電力駆動が可能なた
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S10111S10114
S10111-128Q
S10111-256Q
S10111-512Q
S10112-128Q
S10112-256Q
S10112-512Q
S10113-256Q
S10113-512Q
S10113-1024Q
S10111
S10111S10114
S10113-256Q
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C10500
Abstract: linear CCD 512 TDI cmos image sensor
Text: Selection guide - Sep. 2014 Image Sensors Various types of image sensors covering a wide spectral response range for photometry HAMAMATSU PHOTONICS K.K. Image sensors Various types of image sensors covering a wide spectral response range for photometry H A M A M AT S U d e v e l o p s a n d p r o d u c e s a d vanced image sensors for measurement applications in spectral and energy ranges including infrared, visible, ultraviolet, vacuum ultraviolet, soft X-rays and hard X-rays. We provide
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KAPD0002E12
C10500
linear CCD 512
TDI cmos image sensor
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Untitled
Abstract: No abstract text available
Text: イメージセンサ 1 CCDイメージセンサ 1-1 1-2 1-3 1-4 構造動作原理 特性 使い方 新たな取り組み 2 NMOSリニアイメージセンサ 6-1 6-2 6-3 6-4 6-5 特長 構造 動作原理 特性 使い方 7 InGaAsリニアイメージセンサ
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S10604
Abstract: No abstract text available
Text: 2008 Vol.1 NEWS 2008 Vol.1 E x h i b i t i o n s NEWS Belgium / Denmark / France / Germany / Italy / Japan / Netherlands / Northern Europe / Poland / Portugal / Russia / South Africa / February USGEB 2008 Meeting Lausanne / Switzerland Emerging Technologies in Diagnostic Imaging
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RU-113054
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