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Untitled Abstract: No abstract text available Text: RELIABILITY MONITOR JOB PRODUCT DESCRIPTION FA NO UNIT TEST MODE FAIL MECHANISM P18923 DS12887 BIASED MOISTURE 970059 P18949 DS2175S I/L, 48HR BIASED 970027 P19043 DS5000T TEMP CYCLE 970156 P19044 DS5000T MOISTURE SOAK 970181 P19112 DS1868E I/L, 48HR BIASED	Original	PDF	P18923 P18949 DS12887 DS2175S P19043 P19044 P19112 DS5000T DS1868E
dk52 Abstract: P-16890 17872 p1908 P1875 P-18701 Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-96 Sep-96	Original	PDF	DS1302) Mar-96 Sep-96 Feb-96 Aug-96 Nov-96 Feb-97 May-96 dk52 P-16890 17872 p1908 P1875 P-18701
P-20606 Abstract: c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050 Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS2401 DS2401 DS2401 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-97 Jun-97 Sep-97 Feb-97 Feb-97	Original	PDF	DS1302) Mar-97 Jun-97 Sep-97 Feb-97 May-97 Aug-97 P-20606 c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050
DS1868 Abstract: DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52 Text: RELIABILITY MONITOR PRODUCT DS1302 DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V.SUMMARY DS1	Original	PDF	DS1302 DS1868 DS21S07A DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52
19012 Abstract: No abstract text available Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS2175 Jan-97 9643 D1 ANAM, K. DN634667AAA1 2.0µ OXIDE 16 SOIC STRESS/JOB NO. READPOINT Sample Size/No. of Fails Preconditioning (P/C): T/C: -55°C to +125°C, 10~	Original	PDF	Jan-97 P-18897 P-18948 P-18949, P-19012 P-19013 P-19014 C/100% P-19015 DN634667AAA1 19012
DK53 Abstract: dk52 P-17422 P19500 P1908 P-17411 DN546229ATA DS1000M Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT MONITOR DATE DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 Mar-96 Sep-96	Original	PDF	DS1302) DS1302 DS1868 DS21S07A DS80C320 DK53 dk52 P-17422 P19500 P1908 P-17411 DN546229ATA DS1000M
Untitled Abstract: No abstract text available Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS2175 Jan-97 9643 D1 ANAM, K. DN634667AAA1 2.0µ OXIDE 16 SOIC STRESS/JOB NO. READPOINT Sample Size/No. of Fails Preconditioning (P/C): T/C: -55°C to +125°C, 10~	Original	PDF	Jan-97 P-18897 P-18948 P-18949, P-19012 P-19013 P-19014 C/100% P-19015 DN634667AAA1