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transistor HR Abstract: DS1669 1k39 Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS1669 Feb-97 9647 B2 OMEDATA DD636105AAC 1.2µ OX/NI EEPROM 08 SOIC 208 STRESS/JOB NO. READPOINT Sample Size/No. of Fails Preconditioning (P/C):	Original	PDF	DS1669 Feb-97 DD636105AAC P-19067 P-19128, P-19259 P-19260 transistor HR DS1669 1k39
P-20606 Abstract: c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050 Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS2401 DS2401 DS2401 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-97 Jun-97 Sep-97 Feb-97 Feb-97	Original	PDF	DS1302) Mar-97 Jun-97 Sep-97 Feb-97 May-97 Aug-97 P-20606 c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050
DS1868 Abstract: DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52 Text: RELIABILITY MONITOR PRODUCT DS1302 DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V.SUMMARY DS1	Original	PDF	DS1302 DS1868 DS21S07A DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52
DK53 Abstract: dk52 P-17422 P19500 P1908 P-17411 DN546229ATA DS1000M Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT MONITOR DATE DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 Mar-96 Sep-96	Original	PDF	DS1302) DS1302 DS1868 DS21S07A DS80C320 DK53 dk52 P-17422 P19500 P1908 P-17411 DN546229ATA DS1000M